Paper Title:
Characteristics of Intergrown Superlattice Bismuth-Layered-Structure Ferroelectrics Thin Films Prepared by Sol-Gel Method
  Abstract

Intergrown superlattice Bi3TiNbO9–Bi4Ti3O12 (BTN–BIT) and SrBi4Ti4O15–Bi4Ti3O12 (SBT–BIT) ferroelectric thin films have been prepared on p-Si substrates by sol-gel processing. The precursor thin films are crystallized in the desired intergrown superlattice BTN–BIT and SBT–BIT structures annealed at 700°C. Synthesized BTN–BIT and SBT-BIT thin films exhibited good ferroelectric properties and excellence fatigue endurance. BTN–BIT thin films showed a Pr value approximately 19.1µC/cm2 and a memory window of 0.7V. Although a little smaller Pr value and memory window were observed for the SBT–BIT thin films, the squareness of a P–E hysteresis loop was superior to that of BTN–BIT thin films. Also, the SBT–BIT thin films had more excellence fatigue endurance compared with BTN–BIT thin films.

  Info
Periodical
Advanced Materials Research (Volumes 197-198)
Edited by
Huaiying Zhou, Tianlong Gu, Daoguo Yang, Zhengyi Jiang, Jianmin Zeng
Pages
503-506
DOI
10.4028/www.scientific.net/AMR.197-198.503
Citation
H. Wang, J. Li, J. W. Xu, L. Yang, M. F. Ren, "Characteristics of Intergrown Superlattice Bismuth-Layered-Structure Ferroelectrics Thin Films Prepared by Sol-Gel Method", Advanced Materials Research, Vols. 197-198, pp. 503-506, 2011
Online since
February 2011
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