Paper Title:
Response Analysis at Near Critical Point of Hopf Bifurcation in Nonlinear Systems
  Abstract

It is well known that if for a nonlinear system the parameter p has a small change, the multiple non-semi-simple defective eigenvalue can be separated into close eigenvalues, which is known as the near defective eigenvalue. For such a case, although the close eigenvalues are distinct, the system still has bifurcation property in natural. This paper presents the response analysis method at the near critical point of Hopf bifurcation in nonlinear systems. A numerical example is given to illustrate the application of the proposed method.

  Info
Periodical
Advanced Materials Research (Volumes 199-200)
Edited by
Jianmin Zeng, Zhengyi Jiang, Taosen Li, Daoguo Yang and Yun-Hae Kim
Pages
1098-1101
DOI
10.4028/www.scientific.net/AMR.199-200.1098
Citation
Y. D. Chen, C. Y. Pei, S. H. Chen, X. J. Liu, J. X. Zhang, "Response Analysis at Near Critical Point of Hopf Bifurcation in Nonlinear Systems", Advanced Materials Research, Vols. 199-200, pp. 1098-1101, 2011
Online since
February 2011
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