Paper Title:
Experimental Study on the Precision Lapping of Sapphire Substrate
  Abstract

Experimental research on the surface quality parameters such as roughness and removal rate in the precision lapping of sapphire was promoted in this paper, effects of processing parameters as load, speed of rotation, grain size and density on sapphire surface quality was studied by experiments. Results showed that lapping load and rotate speed were the most important factors on the removal rate, grain size played a key role in the removal rate and roughness under the same conditions, profile tolerance of surface shape depends on the flatness.

  Info
Periodical
Edited by
Congda Lu
Pages
291-294
DOI
10.4028/www.scientific.net/AMR.215.291
Citation
X. Wang, C. D. Lu, D. H. Wen, "Experimental Study on the Precision Lapping of Sapphire Substrate", Advanced Materials Research, Vol. 215, pp. 291-294, 2011
Online since
March 2011
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