Paper Title:
Fabrication and Characterization of MgAl2O4 Thin Films by Sol-Gel Method
  Abstract

This paper describes microstructure characteristics of MgAl2O4 thin films were deposited by sol-gel method with various annealing temperatures. Particular attention will be paid to the effects of an annealing treatment in air ambient on the physical properties. The annealed films were characterized using X-ray diffraction. The surface morphologies of annealed film were examined by scanning electron microscopy and atomic force microscopy. The dependence of the dielectric properties and microstructure characteristics on annealing temperature was also investigated.

  Info
Periodical
Edited by
Yuhang Yang, Xilong Qu, Yiping Luo and Aimin Yang
Pages
514-517
DOI
10.4028/www.scientific.net/AMR.216.514
Citation
C. H. Hsu, J. S. Lin, H. W. Yang, "Fabrication and Characterization of MgAl2O4 Thin Films by Sol-Gel Method", Advanced Materials Research, Vol. 216, pp. 514-517, 2011
Online since
March 2011
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Price
$32.00
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