Paper Title:
Log Defect Detection Based on Wavelet De-Noising and Mathematical Morphological Optimization Algorithm
  Abstract

  Info
Periodical
Advanced Materials Research (Volumes 219-220)
Edited by
Helen Zhang, Gang Shen and David Jin
Pages
420-423
DOI
10.4028/www.scientific.net/AMR.219-220.420
Citation
N. X. Yang, D. W. Qi, "Log Defect Detection Based on Wavelet De-Noising and Mathematical Morphological Optimization Algorithm", Advanced Materials Research, Vols. 219-220, pp. 420-423, 2011
Online since
March 2011
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