Paper Title:
Kelvin Probe Force Microscope Measurement Uncertainty
  Abstract

Kelvin Probe Force Microscopy is an attractive technique for characterizing the surface potential of various samples. The main advantage of this technique is its high spatial resolution together with high sensitivity. However as in any nanoscale measurements also in case of KFM it is extremly difficult to describe the uncertainty of the measurement. Moreover, a wide variety of measuring conditions, together with the complicated operation principle cause situation, where no standard calibration methods are available. In the paper we propose the model of the KFM microscope and analyze the uncertainty of the KFM measurement.

  Info
Periodical
Edited by
Arturs Medvids
Pages
114-117
DOI
10.4028/www.scientific.net/AMR.222.114
Citation
M. Ligowski, M. Tabe, R. Jabłoński, "Kelvin Probe Force Microscope Measurement Uncertainty", Advanced Materials Research, Vol. 222, pp. 114-117, 2011
Online since
April 2011
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Takashi Miwa, Yoshiki Yamakoshi
Abstract:Generally, a laser Doppler velocimetry can estimate particle velocity by forming a standing wave region with crossed beams and by counting...
190
Authors: Yong Zhu, Zhen Chong Wang, Chang Xin Nai, Lu Dong
Chapter 3: Advanced Digital Enterprise
Abstract:Complex resistivity of soil must be measured using low-frequency power supply to overcome the skin effect, but, because of using higher...
333
Authors: Jin Qi Ren, Yao Hua Li, Qiong Xuan Ge, Xun Ma, Lu Zhao
Chapter 13: Vehicle Engineering
Abstract:In high speed train, to obtain precise speed is important to high performance control, though the transducers used in the train are usually...
2052
Authors: Xue Li Zhang, Cun Wei Lu
Abstract:The aim of our research is to realize a high-sensitivity three-dimensional (3-D) shape measurement of target with an optical microscope. On...
280
Authors: Fu Zhong Wang, Fu Kai Zhang, Li Min Zhang
Chapter 6: Sensors and Intelligent Instrument
Abstract:A displacement measurement based on the acceleration sensor, the acceleration signal detection, conditioning hardware circuit design and...
542