Paper Title:
High-Resolution X-Ray Computed Tomography for Materials Research
  Abstract

Nowadays, X-ray tube-based high-resolution CT systems are widely used in scientific research and industrial applications. But the potential, convenience and economy of these lab systems is often underestimated. The present paper shows the comparison of sophisticated conventional µCT with synchrotron radiation-based µCT (SRµCT). The tube-based µCT measurements were performed with a granite-based phoenix nanotom®-CT system (GE Sensing & Inspection Technologies, Wunstorf, Germany) equipped with a 180 kV, 15 W high-power nanofocus tube with tungsten or molybdenum targets. This X-ray tube opens a wide range of applications from scanning low absorbing samples in nanofocus mode with voxel sizes below 500 nm to scanning highly absorbing objects in the high power mode with focal spot and voxel sizes of a few microns. The SRµCT measurements were carried out with the absorption contrast set-up at the beamlines W 2 and BW 2 at HASYLAB/DESY, operated by the GKSS Research Centre.

  Info
Periodical
Edited by
Arturs Medvids
Pages
48-51
DOI
10.4028/www.scientific.net/AMR.222.48
Citation
A. Egbert, O. Brunke, "High-Resolution X-Ray Computed Tomography for Materials Research", Advanced Materials Research, Vol. 222, pp. 48-51, 2011
Online since
April 2011
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