Effect of Trace Yttrium on Properties and Microstructure of Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si Alloy
| Periodical | Advanced Materials Research (Volumes 239 - 242) |
|---|---|
| Main Theme | Advanced Materials |
| Edited by | Zhong Cao, Xueqiang Cao, Lixian Sun, Yinghe He |
| Pages | 338-342 |
| DOI | 10.4028/www.scientific.net/AMR.239-242.338 |
| Citation | Jian Yi Cheng et al., 2011, Advanced Materials Research, 239-242, 338 |
| Online since | May, 2011 |
| Authors | Jian Yi Cheng, Fang Xin Yu, Xue Wen Ao |
| Keywords | Cu-Cr-Zr-Mg-Si alloy, Electrical Conductivity, Hardness, Microstructure, Yttrium |
| Price | US$ 28,- |
Effect of rare earth yttrium on the properties and microstructure of Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si alloy was investigated. The results showed that Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si alloy obtained good comprehensive performance after 80% deformation and then aging at 480˚C for 1h, the hardness and electrical conductivity reached 152HV and 85.5%IACS, respectively. The aging time of Y-containing alloy for attaining peak hardness was postponed and the precipitates were finer (2-4nm) and interparticle spacing was shorter than ones of Y-free alloy. The hardness and electrical conductivity of the Y-containing alloy after 80% deformation and then aging at 480˚C for 45 min reached 174HV and 82.1%IACS, respectively. The tensile fractures of the two alloys which exhibits the obvious feature of tough fracture.