Paper Title:
Effect of Trace Yttrium on Properties and Microstructure of Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si Alloy
  Abstract

Effect of rare earth yttrium on the properties and microstructure of Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si alloy was investigated. The results showed that Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si alloy obtained good comprehensive performance after 80% deformation and then aging at 480°C for 1h, the hardness and electrical conductivity reached 152HV and 85.5%IACS, respectively. The aging time of Y-containing alloy for attaining peak hardness was postponed and the precipitates were finer (2-4nm) and interparticle spacing was shorter than ones of Y-free alloy. The hardness and electrical conductivity of the Y-containing alloy after 80% deformation and then aging at 480°C for 45 min reached 174HV and 82.1%IACS, respectively. The tensile fractures of the two alloys which exhibits the obvious feature of tough fracture.

  Info
Periodical
Advanced Materials Research (Volumes 239-242)
Edited by
Zhong Cao, Xueqiang Cao, Lixian Sun, Yinghe He
Pages
338-342
DOI
10.4028/www.scientific.net/AMR.239-242.338
Citation
J. Y. Cheng, F. X. Yu, X. W. Ao, "Effect of Trace Yttrium on Properties and Microstructure of Cu-0.6Cr-0.15Zr-0.05Mg-0.02Si Alloy", Advanced Materials Research, Vols. 239-242, pp. 338-342, 2011
Online since
May 2011
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