Measurement of Residual Stress in Thin-Sized Steel Wires by Using Focused Ion Beam and Digital Image Correlation Method |
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| Journal | Advanced Materials Research (Volumes 26 - 28) |
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| Volume | Advanced Materials and Processing |
| Edited by | Young Won Chang, Nack J. Kim and Chong Soo Lee |
| Pages | 1187-1190 |
| DOI | 10.4028/www.scientific.net/AMR.26-28.1187 |
| Citation | Yo Sep Yang et al., 2007, Advanced Materials Research, 26-28, 1187 |
| Online since | October, 2007 |
| Authors | Yo Sep Yang, Jong Gu Bae, Chan Gyung Park |
| Keywords | Digital Image Correlation (DIC), Focused Ion Beam (FIB), Residual Stress, Steel Wire |
| Abstract | The residual stress in axial direction of the steel wires has been measured by using a method based on the combination of the focused ion beam (FIB) milling and digital image correlation (DIC) program. The residual stress is calculated from the measured displacement field before and after the introduction of a slot along the steel wires. The displacement is obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot is introduced by FIB milling with low energy beam. The experimental procedures are described and the feasibilities are demonstrated in steel wires fabricated with different conditions. |
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