High-Resolution Dynamic Analysis of the Phase Transformation in Ge2Sb2Te5 Alloy

Zhang, Wei; Song, Se Ahn; Jeong, Hong Sik; Kim, Jin Gyu; Kim, Youn Joong

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Paper Title:

High-Resolution Dynamic Analysis of the Phase Transformation in Ge₂Sb₂Te₅ Alloy

Periodical	Advanced Materials Research (Volumes 26 - 28)
Main Theme	Advanced Materials and Processing
Edited by	Young Won Chang, Nack J. Kim and Chong Soo Lee
Pages	1199-1202
DOI	10.4028/www.scientific.net/AMR.26-28.1199
Citation	Se Ahn Song et al., 2007, Advanced Materials Research, 26-28, 1199
Online since	October, 2007
Authors	Se Ahn Song, Wei Zhang, Hong Sik Jeong, Jin Gyu Kim, Youn Joong Kim
Keywords	Ge₂Sb₂Te₅, Hexagonal Phase, High Resolution Transmission Electron Microscopy, In Situ Heating, Phase Transformation
Price	US$ 28,-

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Abstract

Phase transformation and crystal growth behavior of Ge2Sb2Te5 were investigated systematically by means of in situ heating (from room temperature to 500 oC) of amorphous Ge2Sb2Te5 alloy in a high voltage electron microscope with real-time monitoring. Large-scale crystallization occurred to amorphous Ge2Sb2Te5 around 200 oC. Large crystal growth developed on heating from 200 oC to 400 oC, and single crystalline grains grew up to 150 nm. Eventually the onset of partial melting of thin Ge2Sb2Te5 foil was at 500 oC and liquid Ge2Sb2Te5 was observed for the first time by high-resolution transmission electron microscopy. Hexagonal Ge2Sb2Te5 phase remains after a subsequent cooling.