Structure Characterization of Electrodeposited Zinc Selenide Thin Films |
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| Journal | Advanced Materials Research (Volumes 264 - 265) |
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| Volume | Advances in Materials and Processing Technologies II |
| Edited by | M.S.J. Hashmi, S. Mridha and S. Naher |
| Pages | 732-737 |
| DOI | 10.4028/www.scientific.net/AMR.264-265.732 |
| Citation | S.A. Mohamad et al., 2011, Advanced Materials Research, 264-265, 732 |
| Online since | June, 2011 |
| Authors | S.A. Mohamad, Wan Jeffrey Basirun, Z.A. Ibrahim, A.K. Arof, Mehdi Ebadi |
| Keywords | Crystalline Films, Cyclic Voltammetry, Electrodeposition, ZnSe |
| Abstract | Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio. |
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