Paper Title:
Structure Characterization of Electrodeposited Zinc Selenide Thin Films
  Abstract

Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio.

  Info
Periodical
Advanced Materials Research (Volumes 264-265)
Edited by
M.S.J. Hashmi, S. Mridha and S. Naher
Pages
732-737
DOI
10.4028/www.scientific.net/AMR.264-265.732
Citation
S.A. Mohamad, W. J. Basirun, Z.A. Ibrahim, A.K. Arof, M. Ebadi, "Structure Characterization of Electrodeposited Zinc Selenide Thin Films", Advanced Materials Research, Vols. 264-265, pp. 732-737, 2011
Online since
June 2011
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$32.00
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