Paper Title:
Structural Characteristics and Dielectric Properties of Nd-Doped SrTiO3 Ceramics by Introducing Ti Vacancies for Valence Compensation
  Abstract

By introducing Ti vacancies for valence compensation, Nd-doped SrTiO3 ceramics yielding the formula NdxSr1-xTi1-x/4O3 (0≤x≤0.200) were successfully prepared by solid state reaction route in air. All the ceramics had single perovskite structure indexed by XRD profiles, while the symmetry changed from cubic to tetragonal with increasing x value. The grain size markedly decreased from ~30 μm for un-doped SrTiO3 ceramics to ~1 μm for NdxSr1-xTi1-x/4O3 ceramics with x=0.024, which was observed by scanning electron microscopy (SEM). The dielectric properties were measured at 1 kHz in ambient temperature. The dielectric constant was found to be leading to a maximum value of 5410 for as-sintered sample with x=0.104. The breakdown strength of all NdxSr1-xTi1-x/4O3 samples was examined to be higher than 10 kV/mm. These results indicated that Nd-doped SrTiO3 ceramics could be used to fabricate high voltage capacitors with enhanced energy storage density.

  Info
Periodical
Advanced Materials Research (Volumes 284-286)
Chapter
Ceramic
Edited by
Xiaoming Sang, Pengcheng Wang, Liqun Ai, Yungang Li and Jinglong Bu
Pages
1435-1441
DOI
10.4028/www.scientific.net/AMR.284-286.1435
Citation
Z. Y. Shen, Y. M. Li, Z. M. Wang, Y. Hong, R. H. Liao, "Structural Characteristics and Dielectric Properties of Nd-Doped SrTiO3 Ceramics by Introducing Ti Vacancies for Valence Compensation", Advanced Materials Research, Vols. 284-286, pp. 1435-1441, 2011
Online since
July 2011
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Price
$32.00
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