Paper Title:
ZnO Films Deposited on Various Diamond Film Substrates with Different Surface Roughness
  Abstract

ZnO thin films were deposited by radio frequency (R. F.) magnetron sputtering on various diamond film substrates with different surface roughness. The influence of surface roughness on structural properties and surface morphology of ZnO thin films was investigated by X-ray diffraction (XRD) and atom force microscopy (AFM), respectively. Only on the nanocrystalline and free-standing diamond substrates, ZnO films with preferential c-axis orientation and smooth surface were obtained.

  Info
Periodical
Advanced Materials Research (Volumes 287-290)
Chapter
Thin Films
Edited by
Jinglong Bu, Pengcheng Wang, Liqun Ai, Xiaoming Sang, Yungang Li
Pages
2347-2350
DOI
10.4028/www.scientific.net/AMR.287-290.2347
Citation
R. Fan, L. J. Wang, J. Huang, K. Tang, J. J. Zhang, W. M. Shi, Y. B. Xia, "ZnO Films Deposited on Various Diamond Film Substrates with Different Surface Roughness", Advanced Materials Research, Vols. 287-290, pp. 2347-2350, 2011
Online since
July 2011
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Price
$32.00
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