Lead strontium zirconate titanate (Pb0.92Sr0.08)(Zr0.65Ti0.35)O3 (PSZT) thin films were grown on Pt (111)/Ti/SiO2/Si(100) substrates using a simple sol-gel method. X-ray diffraction studies confirmed that all the PSZT films undergone various thermal process show highly preferred (001)-orientation. On the surface image of the thin film, many clusters are found, which are composed by grains in size of 0.5-0.8 mm. Between the clusters, the nano-size grain is about 50-80 nm. The root mean square (RMS) roughness of the film surfaces is 5.1 nm. PSZT thin film exhibit excellent ferroelectric behavior, demonstrated by reproducible hystersis loops with high remnant polarization (Pr =49 μC cm-2) and relative low coercive field (Ec=53.5 kV cm-1). The pyroelectric coefficients (p) were measured, at 26 °C, the p=215 mC m-2 K-1 for PSZT films. The dielectric properties as well as phase transition behavior were characterized and a ferroelectric to paraelectric transition were found in the vicinity of 196 °C.