Paper Title:
The Design of Automatic Test System of High Speed PCM Signals
  Abstract

This paper presents an automatic test system which can output one 2Mbit / S PCM signals and one 10.2Mbit / S PCM signals for the device testing; the system wih self-test function could calibrate the output two PCM signals; when the equipment is in the state of testing, you can real-time monitor the status of the device through the PC

  Info
Periodical
Advanced Materials Research (Volumes 295-297)
Chapter
Chapter 1: Materials Properties
Edited by
Pengcheng Wang, Liqun Ai, Yungang Li, Xiaoming Sang and Jinglong Bu
Pages
738-741
DOI
10.4028/www.scientific.net/AMR.295-297.738
Citation
S. J. Su, J. Y. Ren, S. H. Liu, H. G. Yang, "The Design of Automatic Test System of High Speed PCM Signals", Advanced Materials Research, Vols. 295-297, pp. 738-741, 2011
Online since
July 2011
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Price
$32.00
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