Paper Title:
Electrochemical Characterization of Metal Oxynitride Thin Film as New Lithium Storage Materials
  Abstract

Metal oxynitride (VxON, CrxON) thin film has been fabricated by reactive dc sputtering method and annealing process. Its electrochemical properties are investigated in a MxON/Li cell. The reversible specific capacities are around 830 mAh g-1 for VxON and 730 mAh g-1 for CrxON. By using selected-area electron diffraction and X-ray photoelectron spectroscopy measurements, New electrochemical reaction mechanism is uncovered, which should be responsible for its good electrochemical performance.

  Info
Periodical
Advanced Materials Research (Volumes 295-297)
Chapter
Chapter 1: Materials Properties
Edited by
Pengcheng Wang, Liqun Ai, Yungang Li, Xiaoming Sang and Jinglong Bu
Pages
912-916
DOI
10.4028/www.scientific.net/AMR.295-297.912
Citation
Y. N. Zhou, Z. W. Fu, "Electrochemical Characterization of Metal Oxynitride Thin Film as New Lithium Storage Materials", Advanced Materials Research, Vols. 295-297, pp. 912-916, 2011
Online since
July 2011
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Price
$32.00
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