Paper Title:
Characterization of TiO2 Film Prepared by Sol-Gel Method Using Ti(OC4H9)4
  Abstract

TiO2 film was dip-coated on glass substrate by a sol-gel process. Ti(OC4H9)4 was used as the titanium source. Surface morphology, crystallite phase, UV-Vis transmittance spectrum and pore size distribution of TiO2 powder prepared under the same conditions of the film were investigated. Surface of TiO2 film is fairly smooth with very slight roughness. No obvious hole or pore is found on the surface of the film. The strongest diffraction peak situated at 2θ=25.3o is the characteristic of anatase TiO2. The absorption edge of the TiO2 film is around 350 nm, while the transmittance fluctuates between 50% and 90%. The average pore size of the TiO2 particles calculated by BJH method is 23 nm. The total pore volume and specific surface area are 0.16 ml/g and 27 m2/g, respectively.

  Info
Periodical
Edited by
Tianbiao Zhang and Jerry Tian
Pages
249-252
DOI
10.4028/www.scientific.net/AMR.298.249
Citation
L. L. Yang, J. W. Bai, W. J. Zhang, "Characterization of TiO2 Film Prepared by Sol-Gel Method Using Ti(OC4H9)4", Advanced Materials Research, Vol. 298, pp. 249-252, 2011
Online since
July 2011
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$32.00
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