Optical Reflection from a Monolayer of Embedded Nano-Objects Covered by a Thick Capping Layer |
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| Journal | Advanced Materials Research (Volume 31) |
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| Volume | Semiconductor Photonics: Nano-Structured Materials and Devices |
| Edited by | S. J. CHUA, J. H. TENG, O. WADA, R. DE LA RUE and X. H. TANG |
| Pages | 52-55 |
| DOI | 10.4028/www.scientific.net/AMR.31.52 |
| Citation | C.M.J. Wijers et al., 2007, Advanced Materials Research, 31, 52 |
| Online since | November, 2007 |
| Authors | C.M.J. Wijers, O. Voskoboynikov |
| Keywords | Embedding, Nano-Objects, Optics |
| Abstract | In a hybrid discrete-continuum description the optical response of a capped monolayer of nano-objects has been determined. The monolayer emits a summation of partial plane waves obeying traditional reflection and transmission, enabling solution of the monolayer dipole strength. For thick capping layers the resulting reflection coefficients could be approximated by analytical expressions. These results have been used to investigate the feasibility of experimental detection of the optical response of nano-object monolayers. |
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