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Optical Reflection from a Monolayer of Embedded Nano-Objects Covered by a Thick Capping Layer

Journal Advanced Materials Research (Volume 31)
Volume Semiconductor Photonics: Nano-Structured Materials and Devices
Edited by S. J. CHUA, J. H. TENG, O. WADA, R. DE LA RUE and X. H. TANG
Pages 52-55
DOI 10.4028/www.scientific.net/AMR.31.52
Citation C.M.J. Wijers et al., 2007, Advanced Materials Research, 31, 52
Online since November, 2007
Authors C.M.J. Wijers, O. Voskoboynikov
Keywords Embedding, Nano-Objects, Optics
Abstract

In a hybrid discrete-continuum description the optical response of a capped monolayer of nano-objects has been determined. The monolayer emits a summation of partial plane waves obeying traditional reflection and transmission, enabling solution of the monolayer dipole strength. For thick capping layers the resulting reflection coefficients could be approximated by analytical expressions. These results have been used to investigate the feasibility of experimental detection of the optical response of nano-object monolayers.

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