Paper Title:
The Finite Ridgelet Transform for Defeat Detection of Quill
  Abstract

A defeat detection method for quill using the finite ridgelet transform is mentioned. This method reduce the average gray values of quill and analytic statistics methods are used in ridgelet transform according to points of quill. After ridgelet transform the linear singularity is further highlighted and the quantization errors caused by cutting image of quill is overcomed. With this method the differences between background and quill are eliminated too and automaticly adjusting the sub-image size for transformation according to the width of quill is realized. The experiment results show that this method can effectively detect smaller linear defects and hence satisfy the industrial production needs.

  Info
Periodical
Advanced Materials Research (Volumes 317-319)
Chapter
Machine Vision
Edited by
Xin Chen
Pages
915-918
DOI
10.4028/www.scientific.net/AMR.317-319.915
Citation
H. J. Liu, R. H. Wang, J. F. Ming, X. C. Li, "The Finite Ridgelet Transform for Defeat Detection of Quill", Advanced Materials Research, Vols. 317-319, pp. 915-918, 2011
Online since
August 2011
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Price
$32.00
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