Paper Title:
Characterization of Silicon Carbide Grit for Fickerts Used in Porcelain Tile Honing and Polishing Process
  Abstract

This paper presents results of morphological and dimensional characterization of silicon carbide (SiC) abrasives used in production of fickerts for the rotary plane honing and polishing process of porcelain tiles. For morphological characterization scanning electron microscopy (SEM) and optical reflection microscopy images were analyzed by software to determine the circularity factor of the particles. In order to analyze the particle size dispersion sieving and laser diffraction were used. Five samples within the same batch of abrasives and with different sizes were characterized. The results show a uniform dispersion with a small variation of the particles size. Regarding the form of particles, the angularity increases in the samples with smaller size. The employed procedure for the analysis of circularity factor is a method frequently used to characterize SiC particles.

  Info
Periodical
Chapter
Chapter 4: Magnet Finishing
Edited by
Taghi Tawakoli
Pages
548-554
DOI
10.4028/www.scientific.net/AMR.325.548
Citation
C. Chiamulera, L. L. Evangelista, F. G. Fernandes, W. L. Weingaertner, R. B. Schroeter, M. C. Fredel, O. E. Alarcon, "Characterization of Silicon Carbide Grit for Fickerts Used in Porcelain Tile Honing and Polishing Process", Advanced Materials Research, Vol. 325, pp. 548-554, 2011
Online since
August 2011
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$32.00
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