Paper Title:
Optical Parameters of Diamond Films Determined by Spectroscopic Ellipsometry Method
  Abstract

Diamond film can be used as optical window materials, mask materials and coating materials of optical device and solar cells. Diamond films with different thickness were prepared by HFCVD method. Raman scattering measurement, SEM and AFM show a good diamond character. Optical parameters in infrared region, such as refractive index (n) and extinction coefficient (k) of diamond films with different thickness were determined by spectroscopic ellipsometry method with a proper fitting model.

  Info
Periodical
Advanced Materials Research (Volumes 347-353)
Chapter
Chapter 8: Energy Materials
Edited by
Weiguo Pan, Jianxing Ren and Yongguang Li
Pages
3468-3471
DOI
10.4028/www.scientific.net/AMR.347-353.3468
Citation
X. Y. Pan, L. J. Wang, J. Huang, K. Tang, M. Bi, W. M. Shi, Y. B. Xia, "Optical Parameters of Diamond Films Determined by Spectroscopic Ellipsometry Method", Advanced Materials Research, Vols. 347-353, pp. 3468-3471, 2012
Online since
October 2011
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Price
$32.00
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