Paper Title:
Semiconductor Lasers Based on the Orthogonal Dual Gloss Meter
  Abstract

The surface brightness values in different directions are different, the measurement of the existing optical gloss meter only once can not simultaneously achieve measurement from different directions, for this phenomenon using orthogonal pairs of optical measurement method, two groups of measurements should be averaged. Measuring probe is made of a 2kHz pulse modulation circuit, silicon photovoltaic cells, I / V conversion, high-pass filter, such as precision rectifier circuit. Measurement probe output signal by the dual analog switch and the ADC into the computer. System software using VB, can realize to show the average computation, numerical analysis and results of statistical functions. Semiconductor laser light source eliminates the need of optical collimating lens. Measurement of laser modulation frequency is 2kHz, much higher than the environmental stray light, using techniques based on frequency domain interference with satisfactory light scattering resisting effect,the test shows that the error caused by stray light is less than 1.5% ,when the instrument works open-ended in the light path.

  Info
Periodical
Advanced Materials Research (Volumes 383-390)
Chapter
Chapter 24: Laser Based Manufacturing
Edited by
Wu Fan
Pages
6297-6302
DOI
10.4028/www.scientific.net/AMR.383-390.6297
Citation
Y. H. Gao, Y. Q. Wang, L. Hao, Y. C. Zhou, "Semiconductor Lasers Based on the Orthogonal Dual Gloss Meter", Advanced Materials Research, Vols. 383-390, pp. 6297-6302, 2012
Online since
November 2011
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Price
$32.00
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