Paper Title:
The Technique for Fabricating Submicron Moiré Grating Using FIB Milling
  Abstract

In this study, focused gallium ion (Ga+) beam is utilised to fabricate micro/submicron spacing gratings on specimen surface. The grating types include: parallel, cross, and hybrid (grating with double-frequency). Several hybrid gratings with double frequency were produced in combination mode or superposition mode, which have a good potential to measure deformation within different range. Techniques for producing different type of gratings are discussed in detail. As an application, a 5000 lines/mm grating was fabricated on an amorphous SIC MEMS cantilever and was successfully used to measure its virtual strain with aid of digital moiré. The experimental results verify the feasibility of fabricating high frequency grating on metal or non-metal surface using the FIB milling and the resultant grating can be used to measure micro-deformation.

  Info
Periodical
Advanced Materials Research (Volumes 47-50)
Edited by
Alan K.T. Lau, J. Lu, Vijay K. Varadan, F.K. Chang, J.P. Tu and P.M. Lam
Pages
710-713
DOI
10.4028/www.scientific.net/AMR.47-50.710
Citation
H. M. Xie, Y. J. Li, H. Du, B. Pan, Q. Luo, C. Z. Gu, H. C. Jiang, "The Technique for Fabricating Submicron Moiré Grating Using FIB Milling ", Advanced Materials Research, Vols. 47-50, pp. 710-713, 2008
Online since
June 2008
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Price
$32.00
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