STM Self-Calibration Technique Based on Image Stitching
| Periodical | Advanced Materials Research (Volume 505) |
|---|---|
| Main Theme | Manufacturing Engineering and Process |
| Edited by | Xiaoxiao Zhou |
| Pages | 61-64 |
| DOI | 10.4028/www.scientific.net/AMR.505.61 |
| Citation | Li Na Wang et al., 2012, Advanced Materials Research, 505, 61 |
| Online since | April, 2012 |
| Authors | Li Na Wang, Bo Hua Yin, Li Han |
| Keywords | Calibration, Image Stitching, STM |
| Price | US$ 28,- |
Scanning tunneling microscope (STM) has several advantages, such as high resolution, and is wildly used. Piezoelectric scanner brings the horizontal resolution of STM up to 0.1 nm, and is it derived by piezoelectric ceramic. Piezoelectric scanner has piezoelectric ceramic’s character. So, piezoelectric scanner output must be calibrated at regular intervals. Graphite atom arrange in a special manner. In the same layer, the distance between adjacent atoms is the same, 0.25nm. This feature can be used to measure length and calibrate small scale scanning. For the 512 × 512 resolution image, the maximum scan range that can distinguish atoms is 30nm2. More large area of atomic image needs to use image stitching technology. By image stitching, small scale scanning, less than 1μm can be calibrated.
