Materials Science & Technology

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Scanning Ion Conductance Microscopy and its Applications in Nanobiology and Nanomedicine

Journal Advanced Materials Research (Volumes 60 - 61)
Volume Micro and Nano Technology
Edited by Xiaohao Wang
Pages 27-30
DOI 10.4028/www.scientific.net/AMR.60-61.27
Citation Li Ping Liu et al., 2009, Advanced Materials Research, 60-61, 27
Online since January, 2009
Authors Li Ping Liu, Yun Dou Wang, Yan Jun Zhang
Keywords Nanotechnology, Patch Clamp, Scanning Ion Conductance Microscopy, Scanning Probe Microscopy
Abstract

In cell biology and medicine study, continuous high spatial resolution observations of living cells would greatly aid the elucidation of the relationship between structure and function of cells. The development of scanning probe microscopy (SPM) has opened up a new era of life science and has been used to develop a family of related methods that allow studying of cell structure and function on nanometer scale. Scanning ion conductance microscopy (SICM) is a new member of such SPM family and can be used to obtain high-resolution non-contact images of the surface of live cells under physiological conditions, and hence allows the relationship between cell microstructure and function to be probed. In this review, we concisely introduce the principles of SICM and its applications in nanobiology and nanomedicine.

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