Paper Title:
Microstructural Characterization of Electro-Deposited CdSe Thin Films
  Abstract

Thin films of CdSe were electrodeposited on tin oxide coated conducting glass substrates at various bath temperatures. The deposited films were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). X-ray diffraction studies revealed that the deposited films are found to be hexagonal structure with preferential orientation along (002) plane. The microstructural parameters such as crystallite size, R.M.S strain, dislocation density, stacking fault probability were calculated using x-ray line profile analysis technique. The variation of microstructural parameters with bath temperature and film thickness were studied and discussed.

  Info
Periodical
Edited by
S. Velumani and René Asomoza
Pages
44-51
DOI
10.4028/www.scientific.net/AMR.68.44
Citation
S. Thanikaikarasan, T. Mahalingam, S.R. Srikumar, T. K. Kim, Y. D. Kim, S. Velumani, R. Asomoza, "Microstructural Characterization of Electro-Deposited CdSe Thin Films", Advanced Materials Research, Vol. 68, pp. 44-51, 2009
Online since
April 2009
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