Paper Title:
Analog Circuits Fault Diagnosis Using Multifractal Analysis
  Abstract

Analog circuits fault diagnosis using multifractal analysis is presented in this paper. The faulty response of circuit under test is analyzed by multifratal formalism, and the fault feature consists of multifractal spectrum parameters. Support vector machine is used to identify the faults. Experimental results prove the proposed method is effective and the diagnosis accuracy reaches 98%.

  Info
Periodical
Chapter
Chapter 2: Advanced Manufacturing and Control Technologies
Edited by
Qingzhou Xu
Pages
367-371
DOI
10.4028/www.scientific.net/AMR.721.367
Citation
Y. K. Sun, Z. B. Yu, "Analog Circuits Fault Diagnosis Using Multifractal Analysis", Advanced Materials Research, Vol. 721, pp. 367-371, 2013
Online since
July 2013
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