Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves |
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| Journal | Advanced Materials Research (Volumes 76 - 78) |
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| Volume | Advances in Abrasive Technology XII |
| Edited by | Han Huang, Liangchi Zhang, Jun Wang, Zhengyi Jiang, Libo Zhou, Xipeng Xu and Tsunemoto Kuriyagawa |
| Pages | 520-525 |
| DOI | 10.4028/www.scientific.net/AMR.76-78.520 |
| Citation | Hideaki Tanaka et al., 2009, Advanced Materials Research, 76-78, 520 |
| Online since | June, 2009 |
| Authors | Hideaki Tanaka, Hiromu Chiba, Yukio Maeda |
| Keywords | Atomic Force Microscope (AFM), Durability, Fixed Abrasives, GMR, Lapping, Magnetic Head, Pinning |
| Abstract | We investigated the durability of giant magnetoresistive (GMR) heads to nanoscale scratches created during the lapping process. Analysis using high-field transfer curves after deliberate scratching with an atomic force microscope (AFM) identified changes in the magnetization of the head and a reduction in pinning strength, which is a magnetic performance indicator. Additionally, finite element method (FEM) analysis suggested that the overall effects on the GMR head following nanoscale scratching increased with scratch depth. |
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