Paper Title:
Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves
  Abstract

We investigated the durability of giant magnetoresistive (GMR) heads to nanoscale scratches created during the lapping process. Analysis using high-field transfer curves after deliberate scratching with an atomic force microscope (AFM) identified changes in the magnetization of the head and a reduction in pinning strength, which is a magnetic performance indicator. Additionally, finite element method (FEM) analysis suggested that the overall effects on the GMR head following nanoscale scratching increased with scratch depth.

  Info
Periodical
Advanced Materials Research (Volumes 76-78)
Edited by
Han Huang, Liangchi Zhang, Jun Wang, Zhengyi Jiang, Libo Zhou, Xipeng Xu and Tsunemoto Kuriyagawa
Pages
520-525
DOI
10.4028/www.scientific.net/AMR.76-78.520
Citation
H. Tanaka, H. Chiba, Y. Maeda, "Evaluation of GMR Head Durability against Nanoscale Scratches Using High-Field Transfer Curves ", Advanced Materials Research, Vols. 76-78, pp. 520-525, 2009
Online since
June 2009
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$32.00
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