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Molecular Dynamics Simulation of Chemo-Mechanical Grinding (CMG) by Controlling Interatomic Potential Parameters to Imitate Chemical Reaction

Journal Advanced Materials Research (Volumes 76 - 78)
Volume Advances in Abrasive Technology XII
Edited by Han Huang, Liangchi Zhang, Jun Wang, Zhengyi Jiang, Libo Zhou, Xipeng Xu and Tsunemoto Kuriyagawa
Pages 82-87
DOI 10.4028/www.scientific.net/AMR.76-78.82
Online since June, 2009
Authors Jun Shimizu, Li Bo Zhou, Takeyuki Yamamoto
Keywords Chemo-Mechanical Grinding (CMG), Interatomic Potential, Molecular Dynamic, Silicon Wafer, Subsurface Damage, Tool Wear
Abstract This paper reports a molecular dynamics simulation of chemo-mechanical grinding (CMG) of silicon wafer by controlling the interatomic potential parameters to imitate the chemo-mechanical or mechano-chemical reactions between an abrasive grain and a Si wafer. Some comparisons between diamond grinding and CMG were made by using the proposed simulation model. From the simulation results, reductions of surface damages, wears of abrasive grain and scratching forces in CMG were confirmed to be same as observed in actual experiments by a CeO2 abrasive wheel, and the availability of proposed simulation model was verified.
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