Paper Title:
Structural and Optoelectronic Properties of Single Crystalline SnO2:Ga Films Deposited on α-Al2O3 (0001) by MOCVD
  Abstract

12% Gallium-doped tin oxide (SnO2:Ga) single crystalline films have been prepared on α-Al2O3 (0001) substrates by the metalorganic chemical vapor deposition (MOCVD) method. The grown temperatures were varied from 400 to 600°C. According to XRD patterns, the film deposited at 500°C has the best single crystalline structure. Subsequently, 3 to 15% doped films were fabricated at 500°C using the same method, except that Gallium organometallic (OM) source was injected in pulsed-mode for the 3, 5 and 10% -doped films. Then, structural and optoelectronic properties of the films were investigated in detail. The obtained films all have the rutile structure of pure SnO2. Film with resistivity of 1.09×10−2Ω cm, carrier concentration of 8.86×1019cm−3 and Hall mobility of 6.49cm2 v−1 s−1 was obtained at 5% of Ga concentration. The average transmittance for the SnO2:Ga films in the visible range were over 90%.

  Info
Periodical
Advanced Materials Research (Volumes 79-82)
Edited by
Yansheng Yin and Xin Wang
Pages
763-766
DOI
10.4028/www.scientific.net/AMR.79-82.763
Citation
X. A. Pei, F. Ji, J. Ma, T. Ning, Z. G. Song, C. N. Luan, Y. L. Tan, "Structural and Optoelectronic Properties of Single Crystalline SnO2:Ga Films Deposited on α-Al2O3 (0001) by MOCVD", Advanced Materials Research, Vols. 79-82, pp. 763-766, 2009
Online since
August 2009
Keywords
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$32.00
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