Paper Title:
The Characteristics of Multilayer Thin Films Deposited with Metal Thin Films (Ag, Al, Cu)
  Abstract

In order to study the characteristics of multilayer thin films with a ZnO/ metal/ ZnO structure the manufacture of the thin films was performed by a dc (direct current) magnetron sputtering system on slide glass substrates. The ZnO thin films were manufactured with the thicknesses of 30 nm and 50 nm. Three kinds of metals (Ag, Al and Cu) were deposited with the thicknesses of 4 nm, 8 nm, 12 nm and 16 nm. The electrical and optical properties of the manufactured thin films were then observed. As a result, the multilayer thin films with an Ag layer represented the most excellent electrical conductivity. This is due to the difference in the fundamental electrical properties of each of the metals. The structures of the metal particles deposited on the ZnO thin films were observed by an SEM (scanning electron microscope). The thin films exhibited a continuous structure with regular spaces between the metal particles. This resulted in an increase of transmittance. This is considered by the decrease of scattering and of light absorption on thin films with a continuous structure.

  Info
Periodical
Advanced Materials Research (Volumes 97-101)
Edited by
Zhengyi Jiang and Chunliang Zhang
Pages
1768-1771
DOI
10.4028/www.scientific.net/AMR.97-101.1768
Citation
D. H. Kim, R. Murakami, Y. H. Kim, K. M. Moon, S. J. An, T. H. Kim, P. P. Wang, "The Characteristics of Multilayer Thin Films Deposited with Metal Thin Films (Ag, Al, Cu)", Advanced Materials Research, Vols. 97-101, pp. 1768-1771, 2010
Online since
March 2010
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$32.00
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