XRDT and TEM Study of Defects and Polytypism in Natural Moissanite and Synthetic SiC Crystals |
| Journal |
Advances in Science and Technology (Volume 48) |
| Volume |
Diamond and Other New Carbon Materials IV |
| Edited by |
P. VINCENZINI and E. CAPPELLI |
| Pages |
61-66 |
| DOI |
10.4028/www.scientific.net/AST.48.61 |
| Online since |
October, 2006 |
| Authors |
G. Tempesta,
G. Agrosì,
G.C. Capitani,
Eugenio Scandale
|
| Keywords |
Dislocation, Micro Channel, Polytype, Transmission Electron Microscopy (TEM), X-Ray Diffraction Topography |
| Abstract |
Structural defects and degree of order of natural and synthetic moissanite have been investigated by
XRD Topography and TEM. XRDT analyses of synthetic 6H-SiC wafers allowed to study extended
defects and to identify and localize coalescence of polytypes. The observed linear defects are microchannels
and dislocations. Axial screw dislocations, either parallel or slightly inclined to the c-axis,
suggest that the growth mechanism for the bulk crystals was mainly by spiral growth. Moreover, the
study of line orientations of the dislocations allow to reconstruct the growth sector evolution of the
sample. Therefore, the convex shape of the growing surface is attained by the development of
growth sectors (10l) neighbouring growth sector (001).
The coalescence of a thin lamella of a different polytype has been also localized and investigated.
The contrast analysis and the diffraction pattern of the lamella are consistent with a 15R-SiC
crystal. Such coalescence indicates local variations of growth conditions.
TEM images and selected area electron diffractions (SAEDs) strongly differentiate natural from
synthetic samples. SAED patterns with [010] incidence of natural crystals are consistent with the
6H polytype and do not show streaks along the [001] stacking direction. Synthetic samples are
comparatively much more disordered. Conventional images show high density of (001) faults, not
observed in natural samples. Consistently, SAED patterns of the [100] zone are streaked along c*.
High resolution (HR) imaging shows that synthetic samples mainly consist of (001) stacking
sequence described as (32)3. Locally mixed stacking sequence described by notation 23(3233)5,
probably referred to a long period polytype, are present. |
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