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Probing the Role of Nanoroughness in Contact Mechanics by Atomic Force Microscopy

Journal Advances in Science and Technology (Volume 51)
Volume Disclosing Materials at the Nanoscale
Edited by P. VINCENZINI and G. MARLETTA
Pages 90-98
DOI 10.4028/www.scientific.net/AST.51.90
Citation Renato Buzio et al., 2006, Advances in Science and Technology, 51, 90
Online since October, 2006
Authors Renato Buzio, Ugo Valbusa
Keywords Atomic Force Microscope (AFM), Contact Mechanics, Roughness
Abstract

Morphological information can be related to significant properties of solid bodies, like their friction, adhesion and wear. The primary aim of the present contribution is to provide evidences of the crucial role played by roughness in contact mechanics, based on Atomic Force Microscopy investigations at the nanoscale. We report experimental results concerning poly(dimethylsiloxane) colloidal probes indenting smooth substrates and discuss the dependence of load-penetration curves and pull-off forces on system details. We suggest their use to perform novel contact mechanics experiments on nanostructured rough surfaces.

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