Paper Title:
The Role of Plastic Deformation in Nanometer-Scale Wear
| Periodical | Advances in Science and Technology (Volume 64) |
|---|---|
| Main Theme | 12th INTERNATIONAL CERAMICS CONGRESS PART C |
| Edited by | Pietro VINCENZINI, Mark HADFIELD and Alberto PASSERONE |
| Pages | 25-32 |
| DOI | 10.4028/www.scientific.net/AST.64.25 |
| Citation | Philip Egberts et al., 2010, Advances in Science and Technology, 64, 25 |
| Online since | October, 2010 |
| Authors | Philip Egberts, Roland Bennewitz |
| Keywords | Atomic Force Microscope (AFM), Dislocation, Ionic Crystal, Ultra High Vacuum, Wear |
| Price | US$ 28,- |
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Abstract
Scratches on KBr(100) surfaces were produced and examined with an atomic force microscope (AFM) operated in an ultra-high vacuum (UHV) environment. Scratches with lengths on the order of 100s of nanometers and depths on the order of atomic layers were investigated. Non-contact AFM topographic images of scratches revealed screw and edge dislocation activity around the scratch sites, illuminating the role of plastic deformation in wear processes. Friction coefficients of approximately 0.3 were measured during scratching, more comparable to macroscopic friction experiments than those measured in low-load, single asperity experiments.
