Papers by keyword «Atomic Force Microscopy (AFM)»
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Growth of SiC Layers on (111) Si by Solid Source Molecular Beam Epitaxy
Authors: Jörg Pezoldt, Thomas Stauden, Volker Cimalla, Gernot Ecke, Henry Romanus, G. Eichhorn
Keywords: AES, Atomic Force Microscopy (AFM), Epitaxy, MBE, Polytypism, RHEED
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AFM Study of In Situ Etching of 4H and 6H SiC Substrates
Authors: S. Karlsson, Nils Nordell
Keywords: Atomic Force Microscopy (AFM), Epitaxy, Etching, Surface Preparation, Surface Roughness
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Phase Formation Sequence of Nickel Silicides from Rapid Thermal Annealing of Ni on 4H-SiC
Authors: Lynnette D. Madsen, Erik B. Svedberg, H.H. Radamson, Christer Hallin, B. Hjörvarsson, C. Cabral, J.L. Jordan-Sweet, C. Lavoie
Keywords: Annealing, Atomic Force Microscopy (AFM), Contact Resistivity, Metallization, Nickel Ni, RBS, RTA, Surface Morphology, Synchrotron, X-Ray Diffraction (XRD)
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6H-SiC MOS Capacitors on Sloped Surfaces: Realisation, Characterisation and Electrical Results
Authors: Frédéric Lanois, Dominique Planson, P. Lassagne, Christophe Raynaud, Edwige Bano
Keywords: Atomic Force Microscopy (AFM), Capacitance Measurements, MOS Capacitors, Plasma Etching, Trench Structure, X-Ray Photoelectron Spectroscopy (XPS)
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MBE Growth of Device-Quality Cubic GaN on Atomically Flat (001) GaAs Prepared by Atomic-Hydrogen Treatment at High Temperatures
Authors: Akira Yoshikawa, Zuo Xiang Qin, H. Nagano, Y. Sugure, A.W. Jia, M. Kobayashi, Y. Kato, Kazuhiko Takahashi
Keywords: Atomic Force Microscopy (AFM), Atomic Hydrogen, Cubic GaN, GaAs Substrate, High Resolution X-Ray Diffraction (HRXRD), MBE, Reciprocal Space Mapping, RHEED
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Investigation of Atomic Structure Ahead of Crack Tip by STM and AFM
Authors: X.D. Li, Yan Bo Wang, W.Y. Chu, Cheng Ming Wang, F. Tian, Y. Zhang, R.D. Xia, C.L. Bai
Keywords: Abnormal Elastic Zone, Atomic Force Microscopy (AFM), Atomic Structure, Crack Tip, STM
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EBIC Characterization of Oxygen Precipitation and Denuded Zone in Intrinsically Gettered P-Type Czochralski Silicon
Authors: S. Spiga, Antonio Castaldini, Anna Cavallini, Maria-Luisa Polignano, F. Cazzaniga
Keywords: Atomic Force Microscopy (AFM), Denuded Zones, EBIC, Intrinsic Gettering, Minority Carrier Diffusion Length, Oxygen Precipitation
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Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)
Authors: J.F. Bresse
Keywords: Atomic Force Microscopy, Atomic Force Microscopy (AFM), EFM, Electronic Devices, Electrostatic Force, Electrostatic Force Microscopy, Surface Potential
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Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials
Authors: Xing Gang Liu, L.J. Balk, G. Shafirstein, A. Eckau, Qing Rui Yin
Keywords: Atomic Force Microscopy (AFM), BaTiO3, Ferroelectric Domain, SEAM
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Improvement of 3C-SiC Surface Morphology on Si(100) by Adding HCl using Atmospheric CVD
Authors: Yi Chen, Yasuichi Masuda, Chacko Jacob, T. Shirafuji, Shigehiro Nishino
Keywords: 3C-SiC/Si, Antiphase Domain, Atomic Force Microscopy (AFM), Heteroepitaxial Growth, Surface Morphology
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