Paper Title:
Influence Intrinsic Elastic Stresses on the Annealing Processes of Radiation Defects in Silicon
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 103-105)
Edited by
Nickolay T. Bagraev
Pages
293-298
DOI
10.4028/www.scientific.net/DDF.103-105.293
Citation
L. I. Khirunenko, Y.V. Pomozov, V.I. Shakhovtsov, V.K. Shinkarenko, V.I. Yashnik, "Influence Intrinsic Elastic Stresses on the Annealing Processes of Radiation Defects in Silicon", Defect and Diffusion Forum, Vols. 103-105, pp. 293-298, 1993
Online since
January 1993
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Price
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