Paper Title:
Possibility of Reconstruction of Concentration Profile of Point Defects in Crystals by the Method of X-Ray Interference Diffractometry
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 103-105)
Edited by
Nickolay T. Bagraev
Pages
491-496
DOI
10.4028/www.scientific.net/DDF.103-105.491
Citation
T.E. Goureev, A. Nikulin, P.V. Petrashen, A.A. Snigirev, "Possibility of Reconstruction of Concentration Profile of Point Defects in Crystals by the Method of X-Ray Interference Diffractometry", Defect and Diffusion Forum, Vols. 103-105, pp. 491-496, 1993
Online since
January 1993
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Price
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