Electron Structure of 11B Impurity in 6H SiC Crystal Measured by Endor |
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| Journal | Defect and Diffusion Forum (Volumes 103 - 105) |
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| Volume | Defects in Semiconductors I |
| Edited by | Nickolay T. Bagraev |
| Pages | 661-666 |
| DOI | 10.4028/www.scientific.net/DDF.103-105.661 |
| Citation | T.L. Petrenko et al., 1993, Defect and Diffusion Forum, 103-105, 661 |
| Authors | T.L. Petrenko, V.V. Teslenko, E.N. Mokhov |
| Full Paper | 
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