Internal Stress Evolution in Multicomponent Thin Metal Films under Electric Current |
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| Journal | Defect and Diffusion Forum (Volumes 129 - 130) |
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| Volume | Diffusion and Stresses |
| Edited by | D.L. Beke and I.A. Szabó |
| Pages | 215-224 |
| DOI | 10.4028/www.scientific.net/DDF.129-130.215 |
| Citation | Leonid M. Klinger et al., 1996, Defect and Diffusion Forum, 129-130, 215 |
| Authors | Leonid M. Klinger, A. Katsman, L. Levin |
| Keywords | Diffusion, Electromigration, Internal Stress, Multicomponent Thin Films |
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