Paper Title:
Internal Stress Evolution in Multicomponent Thin Metal Films under Electric Current
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 129-130)
Edited by
D.L. Beke and I.A. Szabó
Pages
215-224
DOI
10.4028/www.scientific.net/DDF.129-130.215
Citation
L. M. Klinger, A. Katsman, L. Levin, "Internal Stress Evolution in Multicomponent Thin Metal Films under Electric Current", Defect and Diffusion Forum, Vols. 129-130, pp. 215-224, 1996
Online since
March 1996
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Price
$32.00
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