Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements |
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| Journal | Defect and Diffusion Forum (Volumes 134 - 135) |
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| Volume | Defect and Diffusion Forum Vols. 134-135 |
| Edited by | David J. Fisher |
| Pages | 25-32 |
| DOI | 10.4028/www.scientific.net/DDF.134-135.25 |
| Citation | Anna Carbone et al., 1996, Defect and Diffusion Forum, 134-135, 25 |
| Authors | Anna Carbone, P. Mazzetti |
| Keywords | Current Noise Spectroscopy, Deep Defect Levels, Semiconductor, Shallow Defect Levels |
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