Paper Title:
Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 134-135)
Edited by
David J. Fisher
Pages
25-32
DOI
10.4028/www.scientific.net/DDF.134-135.25
Citation
A. Carbone, P. Mazzetti, "Analysis of Defects in Metals, Semiconductors and Photoconducting Insulators through Current Noise Measurements", Defect and Diffusion Forum, Vols. 134-135, pp. 25-32, 1996
Online since
March 1996
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Price
$32.00
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