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Raman Spectroscopy on Amorphous Silicon Based Alloys

Journal Defect and Diffusion Forum (Volumes 134 - 135)
Volume Defect and Diffusion Forum Vols. 134-135
Edited by David J. Fisher
Pages 33-38
DOI 10.4028/www.scientific.net/DDF.134-135.33
Citation Fabrizio Giorgis, 1996, Defect and Diffusion Forum, 134-135, 33
Authors Fabrizio Giorgis
Keywords Raman Spectroscopy, Silicon Based Alloys, Structural Properties
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