Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography |
| Journal |
Defect and Diffusion Forum (Volumes 138 - 139) |
| Volume |
Defect and Diffusion Forum Vols. 138-139 |
| Edited by |
David J. Fisher |
| Pages |
49-62 |
| DOI |
10.4028/www.scientific.net/DDF.138-139.49 |
| Citation |
Shigeru Kimura et al., 1996, Defect and Diffusion Forum, 138-139, 49 |
| Authors |
Shigeru Kimura, Takashi Ishikawa, J. Matsui |
| Keywords |
Fourier Transform Infrared Spectroscopy, Lattice Strains, Microdefect, Oxygen Precipitation, Plane-Wave X-Ray Topography, Silicon, Synchroton Radiation |
| Full Paper |
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