Paper Title:
Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 138-139)
Edited by
David J. Fisher
Pages
49-62
DOI
10.4028/www.scientific.net/DDF.138-139.49
Citation
S. Kimura, T. Ishikawa, J. Matsui, "Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography", Defect and Diffusion Forum, Vols. 138-139, pp. 49-62, 1996
Online since
March 1996
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Price
$32.00
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