Paper Title:
Study of Growth and Shrinkage Mechanism of Extrinsic Stacking Faults in Silicon by Gold Diffusion
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Periodical
Defect and Diffusion Forum (Volumes 143-147)
Edited by
H. Mehrer, Chr. Herzig, N.A. Stolwijk, H. Bracht
Pages
1015-1020
DOI
10.4028/www.scientific.net/DDF.143-147.1015
Citation
M. Morooka, "Study of Growth and Shrinkage Mechanism of Extrinsic Stacking Faults in Silicon by Gold Diffusion", Defect and Diffusion Forum, Vols. 143-147, pp. 1015-1020, 1997
Online since
January 1997
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Price
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