Paper Title:
Diffusion and Surface Segregation in Thin SiGe/Si Layers Studied by Scanning Transmission Electron Microscopy
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 143-147)
Edited by
H. Mehrer, Chr. Herzig, N.A. Stolwijk, H. Bracht
Pages
1135-1140
DOI
10.4028/www.scientific.net/DDF.143-147.1135
Citation
T. Walther, C. J. Humphreys, D.J. Robbins, "Diffusion and Surface Segregation in Thin SiGe/Si Layers Studied by Scanning Transmission Electron Microscopy", Defect and Diffusion Forum, Vols. 143-147, pp. 1135-1140, 1997
Online since
January 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.