Paper Title:
Electronic Properties of Zn in Si1-xGex Alloys: A Basis for Studying Zn Diffusion in SiGe
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 143-147)
Edited by
H. Mehrer, Chr. Herzig, N.A. Stolwijk, H. Bracht
Pages
1141-1146
DOI
10.4028/www.scientific.net/DDF.143-147.1141
Citation
S. Voss, H. Bracht, N. Stolwijk, H. Mehrer, J. Wollweber, "Electronic Properties of Zn in Si1-xGex Alloys: A Basis for Studying Zn Diffusion in SiGe", Defect and Diffusion Forum, Vols. 143-147, pp. 1141-1146, 1997
Online since
January 1997
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Price
$32.00
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