Acceptor Impurities in Silicion Carbide: Electron Paramagnetic Resonance and Optically Detected Magnetic Resonance Studies |
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| Journal | Defect and Diffusion Forum (Volumes 148 - 149) |
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| Volume | Defect and Diffusion Forum Vols. 148-149 |
| Edited by | David J. Fisher |
| Pages | 129-160 |
| DOI | 10.4028/www.scientific.net/DDF.148-149.129 |
| Citation | P.G. Baranov, 1997, Defect and Diffusion Forum, 148-149, 129 |
| Authors | P.G. Baranov |
| Keywords | Acceptor, Defect, Electron Paramagnetic Resonance (EPR), Optically Detected Magnetic Resonance, Silicon Carbide (SiC) |
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