Paper Title:
Point Defect Behaviour Resulting from Dopant Diffusions in Silicon
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 148-149)
Edited by
David J. Fisher
Pages
48-102
DOI
10.4028/www.scientific.net/DDF.148-149.48
Citation
T. Okino, "Point Defect Behaviour Resulting from Dopant Diffusions in Silicon", Defect and Diffusion Forum, Vols. 148-149, pp. 48-102, 1997
Online since
March 1997
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Price
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