Paper Title:
Grain Boundary Electromigration in Thin Films: Interface Reaction and Segregation Effects
  Abstract

  Info
Periodical
Edited by
B. Bokstein and N. Balandina
Pages
147-160
DOI
10.4028/www.scientific.net/DDF.156.147
Citation
E. E. Glickman, "Grain Boundary Electromigration in Thin Films: Interface Reaction and Segregation Effects", Defect and Diffusion Forum, Vol. 156, pp. 147-160, 1998
Online since
February 1998
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Price
$32.00
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