Low-Temperature Interdiffusion in Binary and Multilayer Thin Film System |
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| Journal | Defect and Diffusion Forum (Volume 156) |
|---|---|
| Volume | Grain Boundary Diffusion and Grain Boundary Segregation |
| Edited by | B. Bokstein and N. Balandina |
| Pages | 215-222 |
| DOI | 10.4028/www.scientific.net/DDF.156.215 |
| Citation | Sergey I. Sidorenko et al., 1998, Defect and Diffusion Forum, 156, 215 |
| Authors | Sergey I. Sidorenko, S.M. Voloshko, M.A. Vasiliev |
| Keywords | Auger Electron Spectroscopy (AES), Diffusion, Interface, Thin Film |
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