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Annealing-Related Phenomena in Bulk Semi-Insulating Indium Phosphide

Journal Defect and Diffusion Forum (Volumes 157 - 159)
Volume Diffusion in GaAs and other III-V Semiconductors
Edited by D.J. Fisher
Pages 103-112
DOI 10.4028/www.scientific.net/DDF.157-159.103
Citation J. Jiménez et al., 1998, Defect and Diffusion Forum, 157-159, 103
Authors J. Jiménez, R. Fornari
Keywords Electrical Compensation, Homogeneity, Ingot Annealing, Iron Doping, Native Donors, Wafer Annealing
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